感知诊断监测SENSEDIAGNOSEMONITOR

Semiconductor Manufacturing

For etch, deposition, cleaning, and chamber development, we deliver measurement planning, interface deployment, process commissioning, parameter analysis, and result delivery.

EtchDepositionChamber diagnostics
Semiconductor Manufacturing CHAMBER DIAGNOSTICS · PROCESS DATA
FABCHAMBER DIAGNOSTICS · PROCESS DATA
SYSTEM ARCHITECTURE

The diagnostic system connects the test object to target data

The system connects diagnostic instruments, engineering interfaces, motion control, timing control, data acquisition, calibration, analysis, and technical services.

TEST OBJECT AND TEST TARGETSemiconductor Manufacturing

Etch · Deposition · Chamber diagnostics

01

Diagnostics and Measurement

  • Plasma parameter measurement
  • Optical emission monitoring
  • Ion energy and flux analysis
  • Measurement-point positioning and scan mechanics
02

Control and Acquisition

  • Recipe synchronization
  • Multi-channel acquisition
  • Batch traceability
  • Runtime status monitoring
03

Engineering Integration

  • Chamber-port adaptation
  • Flange and fixture design
  • Cabling and control interfaces
  • Site installation and safety interlocks
04

Data and Service

  • Parameter extraction and comparison analysis
  • Report generation
  • Operation procedures
  • Training materials and maintenance support
Calibration and system commissioning connect all system modules
SYSTEM OUTPUTTarget Data and Deliverables
  • Process baselines, parameter comparison sheets, and abnormality summaries
  • Trend records, key-parameter reports, and batch comparison results
  • Interface notes, commissioning records, and implementation recommendations
TARGET MEASUREMENTS

Applicable Process Projects

01

Etch Process Development and Verification

Focus Metrics
Plasma density, electron temperature, ion energy, and chamber consistency
Applicable Scenarios
New recipe development, process-window confirmation, and cross-tool comparison
Deliverables
Process baselines, parameter comparison sheets, and abnormality summaries
02

Deposition and Thin-Film Process Monitoring

Focus Metrics
Plasma stability, deposition rate, ion flux, and batch consistency
Applicable Scenarios
PVD and PECVD development, film-quality evaluation, and production transfer
Deliverables
Trend records, key-parameter reports, and batch comparison results
03

Chamber Diagnostics and Platform Introduction

Focus Metrics
Port arrangement, interface alignment, timing synchronization, and equipment integration
Applicable Scenarios
New chamber development, platform upgrades, and process-line transfer
Deliverables
Interface notes, commissioning records, and implementation recommendations
SYSTEM IMPLEMENTATION

Implementation Flow

The technical team confirms the target, designs the system, connects the interfaces, calibrates the instruments, completes the data analysis, and supplies the deliverables.

  1. 01

    Process Requirement Confirmation

    Confirm process type, chamber condition, recipe stage, measurement points, and focus metrics.

    Process scope and constraintsMeasurement-point and operating-condition list
  2. 02

    Solution Design and Interface Deployment

    Define the diagnostic chain, installation positions, acquisition logic, recipe synchronization, and safety interfaces.

    Measurement planInterface notesDeployment checklist
  3. 03

    Process Commissioning and Data Acquisition

    Complete installation and commissioning, baseline confirmation, batch acquisition, and abnormality re-checks.

    Commissioning recordsProcess baselinesRaw data packages
  4. 04

    Parameter Analysis and Delivery

    Complete key-parameter extraction, batch comparison, abnormality localization, and report delivery.

    Parameter reportsComparison analysisOperation procedures and support suggestions
SYSTEM DELIVERY

Data and System Delivery

The delivery includes system configuration, interface data, calibration records, raw data, analysis reports, operation instructions, and technical services.

01

Solution dossier and measurement-point configuration list

Clarify the implementation scope, measurement layout, and configuration logic.

02

Chamber interface and installation notes

Document port positions, mounting constraints, and interface definitions.

03

Process baselines and calibration records

Provide baseline parameters, calibration paths, and verification records.

04

Raw data package and batch comparison sheet

Deliver raw datasets, naming rules, and batch-to-batch comparison tables.

05

Parameter analysis report and abnormality summary

Summarize key parameters, trend changes, and analysis conclusions.

06

Operation procedures training materials and maintenance recommendations

Cover operation guidance, routine re-checks, and follow-on maintenance suggestions.

TECHNICAL SERVICES

Implementation Support

On-site commissioning supportBatch re-check supportRemote or on-site collaboration
TECHNICAL DISCUSSION

Configure the Diagnostic System for Your Target Data

Send us the test object, target parameters, and site conditions. The technical team will give the system configuration, interfaces, calibration method, data format, and implementation plan.