A solution connects products and services for one test target A solution starts with your test target. It connects diagnostic products, calibration, data acquisition, system integration, and technical services for one task.
01 PLUME DIAGNOSTICS · THRUST
Plume diagnostics · Thrust measurement · Ground tests Electric Propulsion Connect plume diagnostics and micro-thrust measurements in one test system.
End-to-end micro-thrust and plume diagnostics for EP ground testing.
PRODUCT SET
Langmuir probes Faraday probes RPA / RFEA E×B probes Micro-thrust stands
SYSTEM CAPABILITIES
Measure plume properties, ion energy, charge states, and current density. Measure steady and transient micro-thrust. Connect calibration, motion, acquisition, and analysis. 02 CHAMBER DIAGNOSTICS · PROCESS DATA
Etch · Deposition · Chamber diagnostics Semiconductor Manufacturing Measure chamber plasma and compare different process conditions.
Traceable plasma diagnostics for etch, deposition, and cleaning process control.
PRODUCT SET
Langmuir probes Optical emission spectroscopy Data acquisition
SYSTEM CAPABILITIES
Measure electron properties and optical emission. Compare chamber conditions at different operating points. Configure the probe and optical path for the chamber. 03 BEAM MEASUREMENTS · SURFACE TREATMENT
Ion beams · Thin films · Uniformity Surface Engineering Measure beam energy, current, and uniformity before material treatment.
Ion-source and process-window optimization for consistent surface modification.
PRODUCT SET
Faraday probes RPA / RFEA E×B probes Kaufman and Hall ion sources
SYSTEM CAPABILITIES
Configure ion sources and vacuum interfaces. Measure beam current and uniformity. Measure ion energy and charge states. 04 SYSTEM INTEGRATION · DATA ANALYSIS
Platforms · Combined tests · Method development R&D Connect diagnostic hardware, software, motion, and analysis in one laboratory platform.
Reusable diagnostic workflows and data pipelines for research platforms.
PRODUCT SET
Contact diagnostics OES / LIF / Thomson scattering Plasma sources Test platforms
SYSTEM CAPABILITIES
Define the system architecture. Connect contact and optical diagnostics. Integrate motion, acquisition, and analysis. 
