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Core Pages
Solutions
- Electric Propulsion Solution
Micro-thrust measurement, plume diagnostics, and integrated validation workflow
- Semiconductor Manufacturing Solution
Plasma monitoring and optimization for etch, deposition, and cleaning
- Surface Engineering Solution
Ion-source and parameter optimization for surface process consistency
- R&D Solution
Standardized diagnostics and reusable data workflows for research platforms
Contact Diagnostics
- XHINS-LP Langmuir Probes
Single/double/triple/emissive probes measuring electron density, temperature, and more
- XHINS-FP Faraday Probe / Faraday Cup
Ion current density and plume distribution measurements
- XHINS-ExB Probe / Wien Filter / Particle Velocity Selector
Ion energy and velocity distribution measurements
- XHINS-RPA Ion Energy Analyzer (RPA / RFEA)
Ion energy distribution and plume divergence measurements
Optical Diagnostics
- XHINS-OES Optical Emission Spectroscopy
Plasma emission spectra, species density, excitation temperature
- XHINS-LIF Laser-Induced Fluorescence
Ion/neutral velocity distribution and temperature
- XHINS-TS Thomson Scattering
High-accuracy electron density and temperature measurements
Plasma Sources
- XHINS-KIS Kaufman Ion Source
DC gridded ion source for etching, coating, and process lines
- XHINS-HT Hall Thruster
Core EP component with high specific impulse and long life
- XHINS-RFIS RF Ion Source
RF-coupled plasma source for surface processing
- XHINS-CA Cathodic Arc Source
High ionization, energetic metal ion beams for hard coatings
Micro Thrust Stands
- XHINS-TB Torsion Balance Thrust Stand
High-precision micro-thrust measurement for thruster tests
- XHINS-EMB Electromagnetic Balance Thrust Stand
Fast-response thrust measurement
- Calibration Service
Thrust stand calibration and probe calibration services