Products & Services

Contact Diagnostics

Directly place probes in plasma to measure core parameters.

XHINS-LP Langmuir Probe Products

Automated I–V scans for core parameters; supports single/double/triple/emissive probes.

Electron density ( $n_e$ ), ion density ( $n_i$ )
Electron temperature ( $T_e$ )
Plasma potential ( $V_p$ ), floating potential ( $V_f$ ), electron energy distribution function (EEDF)

XHINS-FP Faraday Probe / Faraday Cup

Measures the spatial distribution of ion current density with a probe scan. The data also give total ion current, beam uniformity, and beam divergence. For a pulsed ion source, a known flight path, calibrated time zero, and fast acquisition give TOF arrival-time data.

Spatial distribution of ion current density
Total ion current, beam uniformity, and divergence angle
Pulsed-current waveform and TOF arrival-time distribution

XHINS-EBP ExB Probe / Wien Filter / Particle Velocity Selector

Uses crossed electric and magnetic fields to filter ions by charge-to-mass ratio, precisely measuring charge-state fractions and velocity distributions for plume composition diagnostics.

Ion charge-state fractions (Xe⁺, Xe²⁺, Xe³⁺, etc.)
Ion velocity distribution (IVDF)
Plume impurity identification

Ion Energy Analyzer (RPA: Retarding Potential Analyzer / RFEA: Retarding Field Energy Analyzer)

The analyzer changes the retarding voltage in a selected range and records the collector current. The retarding curve gives the ion energy-per-charge spectrum. This spectrum is the primary output. For repeatable pulsed ion sources, synchronized I(t) measurements at fixed voltages give time-resolved spectra. The RPA supplies energy selection for energy-resolved TOF systems.

Ion energy-per-charge spectrum (E/q)
Retarding curve, spectral peak, and energy spread
Time-resolved spectra and energy selection for TOF systems

Contact Diagnostics
Product type	Main output parameters	Measurement task
Langmuir probes
Single probe	Ion density ( $n_i$ ), electron density ( $n_e$ ), electron temperature ( $T_e$ ), plasma potential ( $V_p$ ), floating potential ( $V_f$ ), EEDF	Steady parameter measurements and spatial scans in low-temperature plasmas
Double probe	Electron density ( $n_e$ ), electron temperature ( $T_e$ )	Atmospheric-pressure plasma jets, floating devices, and discharges with strong interference
Triple probe	Electron density ( $n_e$ ), electron temperature ( $T_e$ )	Time-resolved measurements of pulsed discharges and transient thruster operation
Emissive probe	Plasma potential ( $V_p$ )	Plasma-potential measurements in sheaths, near-wall regions, and thruster plumes
Other plasma probes
Magnetic probe	Magnetic field (B)	Magnetic-disturbance measurements in confinement devices and field-distribution checks in thrusters
Faraday probe / Faraday cup	Spatial ion current-density distribution, total ion current, and TOF arrival-time distribution	Thruster plume scans, beam-uniformity assessments, and pulsed-ion-source TOF measurements
Ion-beam composition and energy analyzers
ExB probe / Wien filter / particle velocity selector	Relative fractions of ion charge states, ion velocity distribution, and plume impurity identification	Charge-state, velocity-distribution, and composition measurements in electric-propulsion plumes
Ion energy analyzer (RPA / RFEA)	Retarding curve, ion energy-per-charge spectrum (E/q), and collected ion current	Retarding-voltage scans for ion energy-per-charge spectra, energy-spread analysis, time-resolved spectra, and energy selection for TOF systems

Optical Diagnostics

Remote measurements via spontaneous emission and light–matter interaction with high selectivity and spatiotemporal resolution.

Optical Emission Spectroscopy (OES)

Identify species, measure densities, estimate excitation/electron temperature.

Species identification
Excitation / electron temperature (model-based)
Process and stability monitoring

Laser-Induced Fluorescence (LIF)

Tunable laser excitation for selective detection of density and velocity.

Target species density
Velocity distribution (VDF / IVDF)
Particle temperature

Thomson Scattering

Measure elastic scattering spectra of electrons to obtain temperature and density.

Electron temperature ( $T_e$ )
Electron density ( $n_e$ )

Optical Diagnostics
Method	Diagnostic results	Measurement task
Spectroscopy & laser diagnostics
Optical Emission Spectroscopy (OES)	Emitting species; model estimates of excitation temperature, electron temperature, and relative density	Discharge-state and uniformity monitoring; process endpoint detection
Laser-Induced Fluorescence (LIF)	Target-particle density (with calibration), velocity distribution (VDF / IVDF), and temperature	Thruster plume velocity fields and trace-particle diagnostics
Thomson Scattering	Electron temperature ( $T_e$ ) and electron density ( $n_e$ )	Electron-parameter measurements in laboratory plasmas and magnetic-confinement devices

Plasma Sources

Stable, controllable ion beam assemblies for labs, EP ground systems, and etch/material lines; includes beam conditioning, grid optics, and neutralizer options.

XHINS-KF Kaufman Ion Source Systems

Ionization chamber with porous anode, neutralizer included; wide energy tuning for ground EP systems and beam research.

Energy: 50–1500 eV (customizable)
Beam current density: up to mA/cm²
Gases: Ar / Xe / N₂ etc.

XHINS-HS Hall Ion Source Systems

E×B drift discharge, compact form; supports EP lifetime tests and lab prototypes.

Discharge voltage: 150–600 V (typ.)
High thrust-to-weight and efficiency
Compatible with inert gases

XHINS-CA Cathodic Arc Plasma Source Systems

Evaporates and ionizes cathode material to deliver high-current metal ion beams for materials and surface engineering.

Energy: ~50–200 eV (extendable with bias)
High-current beam (pulsed/steady)
Materials: various metal cathodes

XHINS-RF RF/ICP Plasma Source Systems

RF-coupled, electrode-free, clean low-damage source for etch/clean lines and research.

Frequency: 13.56 MHz (customizable)
High-density, low-energy beam
Windows: quartz / Al₂O₃ etc.

Plasma Sources
Type	Key parameters	Uses and test environments
Kaufman ion source	Operating principle Hot cathode / DC discharge Ion energy (eV) 50 – 1500 (widely tunable) Suitable propellants Ar, Xe, N₂ (inert/reactive) Neutralizer Required (hot cathode)	Main use Ion beam sputtering, materials modification Application Ground EP, etch/coating
Hall source	Operating principle E×B closed-loop discharge Ion energy (eV) 150 – 600 (medium) Suitable propellants Xe, Kr, Ar Neutralizer Required (hollow cathode)	Main use Space propulsion, surface treatment Application EP lifetime/performance tests
Cathodic arc source	Operating principle Vacuum arc discharge Ion energy (eV) ~50 – 200 (multiply charged) Suitable propellants Metals (Ti, C, Cu, etc.) Neutralizer Self-neutralized (plasma)	Main use Hard coatings (TiN), thin film deposition Application Materials, surface engineering
XHINS-RF Series RF Plasma Source System (RF/ICP)	Operating principle Inductively coupled discharge Ion energy (eV) < 100 (low) Suitable propellants Ar, O₂, N₂, H₂ Neutralizer Optional (grid extraction)	Main use Semiconductor etching, cleaning, assisted deposition Application Wafer etching, wafer cleaning, and material tests that require low surface damage
XHINS-ECR ECR Plasma Source Systems	Operating principle Electron cyclotron resonance Ion energy (eV) 10 – 2000+ (wide range) Suitable propellants Ar, O₂, N₂, multiply charged ions Neutralizer Optional (grid extraction)	Main use Multiply charged plasma source, space propulsion, injection Application Multiply charged beams for fundamental research facilities, specialty ion excitation in propulsion/etching experiments

Micro Thrust Stands

Deliverable thrust stands for low-thrust thrusters and plasma sources, including platform, calibration tools, and test software for vacuum and long-duration runs.

XHINS-TTS Torsional Thrust Stand

High-sensitivity torsion structure for steady and slowly varying thrust.

Resolution / drift control
Displacement/angle readout chain
Thermal and exhaust torque compensation

XHINS-ETS Electromagnetic Thrust Stand

Electromagnetic/electrostatic balance with closed-loop control and rapid calibration; covers mN-class long-duration thrust.

Force feedback linearity
Bandwidth and noise
Vacuum feedthrough and thermal management

Calibration, Damping, Compensation, Feedback & Sensing Modules

DAQ, processing software, and uncertainty tools for thrust stand delivery.

System identification and calibration
Uncertainty modeling
Acceptance report (with raw data)

Micro Thrust Stands
Product or module	Main specification or function	Measurement task
Thrust Stand Platforms
Torsion balance thrust stand	Thrust range: 1 μN–100 mN (customizable); resolution depends on the range and readout chain	Steady and slowly varying thrust measurements and in-vacuum thrust calibration
Electromagnetic balance stand	Thrust range: 10 μN–1 N (customizable); electromagnetic or electrostatic closed-loop force feedback	Steady thrust measurements of Hall and ion thrusters; impulse measurements of pulsed thrusters
Calibration, Readout, and Data Processing
Displacement or force readout module	Laser-interferometer or grating-displacement readout; low-noise instrumentation amplifier	Collects displacement or force-sensor signals for thrust calculations and dynamic analysis
Automated operation software	Digital filtering, thermal-drift correction, impulse calculation, and GUM measurement-uncertainty evaluation	Gives thrust curves, statistical results, and measurement-uncertainty reports
Experimental Environment & Adaptation
Vacuum & propellant support	Vacuum system and Xe, Ar, and Kr storage and supply module	Ground tests of thrusters and vacuum tests of plasma sources
Mounting & flange adaptation	Custom mounting fixtures, interface adapters, and interlock interfaces	Connection to existing vacuum chambers or plasma test platforms